Thank you for your interest in NSN part number 15-1326286-1 under NSN 5962013757492 on Click Aerospace. Click Aerospace is a website owned and operated by ASAP Semiconductor, offering customers access to an unparalleled inventory of premium parts that cater to a variety of industries and applications. Microcircuit Memory is an item listed with the part number 15-1326286-1, and FSC 5962 Microcircuits Electronic and it is manufactured by Gte Government Systems Corp having CAGE Code 11293. This item, alongside the rest of our listed NSN parts, is readily available for purchase through our website now. Get started on the purchasing process today by filling out and submitting an Instant RFQ as provided through our website. Once received, a member of our staff will reach out to you in 15 minutes or less to offer a personalized quote based on your individual needs.
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Click Aerospace is a leading independent distributor of NSN part 15-1326286-1, and we can help you procure NSN components such as 5962013757492 and many more. The quality of our inventory is of the utmost importance to us, and thus we choose to only source our parts from global manufacturers like Gte Government Systems Corp. Get started with a competitive quote today when you submit an Instant RFQ and experience how we are revolutionizing the parts procurement process.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-375-7492 Item Description: Microcircuit Memory | 5962 | 013757492 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
15-1326286-1 | 5 | 2 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
AGAV | End Item Identification | HAC/RMPE REACT BASIC |
NHCF | Nuclear Hardness Critical Feature | HARDENED |
CZZZ | Memory Capacity | 128K X 8 |
CTQX | Current Rating Per Characteristic | 5.00 MICROAMPERES MAXIMUM INPUT |
CBBL | Features Provided | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
CZER | Memory Device Type | EPROM |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
ADAT | Body Width | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
FEAT | Special Features | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
SPCL | Special Test Features | SELECTED AND TESTED FOR RADIATION HARDNESS |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
ADAQ | Body Length | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
AEHX | Maximum Power Dissipation Rating | 330.0 MILLIWATTS |
ADAU | Body Height | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
CZEN | Voltage Rating And Type Per Characteristic | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
TTQY | Terminal Type And Quantity | 32 PRINTED CIRCUIT |
CQSJ | Inclosure Material | CERAMIC |
CXCY | Part Name Assigned By Controlling Agency | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
MRC | Decoded Requirement | Clear Text Reply |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
CWSG | Terminal Surface Treatment | SOLDER |
CZEQ | Time Rating Per Chacteristic | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
CQWX | Output Logic Form | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | Criticality Code Justification | FEAT |
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